Event Info For your interest, please see below information regarding our upcoming seminar on aberration-corrected transmission electron microscopy:
FACTS Seminar:
“Applications and Recent Advancements In Aberration-Corrected TEM: A Sneak Peek Into The Future Of Advanced Microscopy at FACTS” Date: 7 Dec 2016, 10am-12pm Location: MSE Meeting Room (N4.1-01-28) Presenter: Chris Boothroyd, FACTS Abstract:
The maximum achievable resolution of electron microscopes is not limited by the fundamental properties of electrons, but rather by intrinsic imperfections of their electron lenses, of which the most severe is spherical aberration. While methods to overcome aberrations have been known for many years, it is only recently that practical aberration correctors have been developed for the latest generation of transmission electron microscopes. In this talk, the speaker will describe on how aberration correctors work, present examples of some investigations made using aberration-corrected TEMs and introduce the new instruments which will be coming to FACTS in 2017. For more information on FACTS, please visit our website at facts.ntu.edu.sg
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