Event Info An introduction to SEM-based X-ray microanalysis (EDS and WDS)
Date: 12 March 2019 Time: 2-4pm Instructor: Jason Herrin (Dr) Location: FACTS ABN
In scanning electron microscopes, X-ray microanalysis can be performed by bombarding a specimen with a focused electron beam and analyzing the emitted X-rays in order to determine the chemical composition of a specific region of interest. Both qualitative and quantitative analyses are possible, as is chemical mapping of specimens. Energy-dispersive spectroscopy (EDS) and wavelength-dispersive spectroscopy and are two related X-ray analytical techniques available to FACTS users, and we will discuss both of these methods. Free coffee and donuts will be provided. Registration for this event has closed. |