Event Info X-ray diffraction (XRD) is typically used to measure lattice spacings of a crystalline material for phase identification and quantification. When the crystals are subjected to stress the lattice spacing can increase or decrease, and by measuring these changes using XRD the micro/macro stress-strain state of materials can be evaluated. XRD measurements are non-destructive and requires less rigid sample preparation step making it more suitable for various applications. In this short course the method to evaluate the stress-strain state of a material using diffraction techniques, such as sin2y method, will be introduced along with different case scenarios and examples.
Speaker: Dr Pio John S. Buenconsejo Senior Research Fellow, FACTS, NTU Singapore
Pio is a materials scientist specialising in applications of X-ray scattering and diffraction analysis for materials. His research interest includes combinatorial materials science, high-throughput materials characterisation and R&D of shape memory alloys. Registration for this event has closed. |