FACTS Short Course: Residual stress analysis of materials using X-ray diffraction

Event Date 20 Apr 2023 (Thu), 02:00 PM - 04:00 PM
Venue FACTS@ABN (ABN-B4b-10), TELS Room
Organiser FACTS (Email :  Tel/Fax : 67906158)

Event Info

X-ray diffraction (XRD) is typically used to measure lattice spacings of a crystalline material for phase identification and quantification. When the crystals are subjected to stress the lattice spacing can increase or decrease, and by measuring these changes using XRD the micro/macro stress-strain state of materials can be evaluated. XRD measurements are non-destructive and requires less rigid sample preparation step making it more suitable for various applications. In this short course the method to evaluate the stress-strain state of a material using diffraction techniques, such as sin2y method, will be introduced along with different case scenarios and examples.



Dr Pio John S. Buenconsejo

Senior Research Fellow, FACTS, NTU Singapore


Pio is a materials scientist specialising in applications of X-ray scattering and diffraction analysis for materials. His research interest includes combinatorial materials science, high-throughput materials characterisation and R&D of shape memory alloys.

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