• In order to collect high-quality images with transmission electron microscopes, samples have to be specially prepared so that their dimensions meet the requirements of the microscope.
• Depending on the nature of the materials to be examined, different sample preparation techniques are required, and these will be introduced in this short course.
• Users often encounter other sample problems that prevent them from obtaining images. These will be discussed in the short course as well.
• This short course is recommended for current and potential TEM users
Dr Tay Yee Yan
Senior Research Fellow, FACTS, NTU Singapore
Dr Tay received his Ph.D. degree from the School of Materials Science and Engineering at Nanyang Technological University (NTU). He joined the Facility for Analysis Characterisation Testing & Simulation (FACTS) shared facilities, NTU in 2010, where he is in charge of the transmission electron microscopes (TEM). He was also involved with designing the purpose-built AToM@FACTS building, which currently houses the two state-of-the-art aberration corrected TEMs in the facility.
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