| Proj No. | A2137-251 |
| Title | Automated mapping of electrical properties for development of next generation large area printed electronics |
| Summary | This project aims to develop a novel instrument capable of performing automated large-area four-point probe measurements or transistor measurements. The student will work with automated hardware to measure the electrical properties. The project uses high-throughput hardware and integrates with an optimization algorithm. Student with some machine learning experience (basic AI courses) will be preferred. |
| Supervisor | A/P Leong Wei Lin (Loc:S1 > S1 B1C > S1 B1C 102, Ext: +65 67904389) |
| Co-Supervisor | - |
| RI Co-Supervisor | - |
| Lab | Nanomaterials lab (Loc: S2.1-B5-01) |
| Single/Group: | Single |
| Area: | Digital Media Processing and Computer Engineering |
| ISP/RI/SMP/SCP?: |