Event Info This series of Advanced Topics for Transmission Electron Microscopy (TEM) will take place on 4 consecutive morning (10am - 12pm) and the topics are as follows:
High-resolution Transmission Electron Microscopy Our highest resolution transmission electron microscope (TEM) can resolve features with a resolution of better than 0.1nm. But the resulting images are not straightforward to interpret. This talk will cover the theory behind the scattering of electrons by materials, the formation of images in the electron microscope and simulation of images. An understanding of the material covered in the introduction to TEM will be assumed.
Scanning Transmission Electron Microscopy Scanning transmission electron microscopy (STEM) is an alternative to TEM for imaging thin samples in transmission. STEM images are usually easier to interpret than TEM images and STEM can do chemical mapping at high resolution. This talk will cover the theory behind STEM imaging and the variety of information that can be obtained from STEM. An understanding of the material covered in the introduction to TEM will be assumed.
X-ray Spectroscopy in the Transmission Electron Microscope Electron irradiation in a TEM creates X-rays whose energies can be used to identify the elements present in a sample. This talk will cover the generation of X-rays, how X-rays are recorded and how to interpret the resulting spectra. This talk overlaps with some of the material covered in "SEM-based X-ray microanalysis (EDS and WDS)" but will be more focused on TEM. Some understanding of the material covered in the introduction to TEM will be useful.
Electron Energy-loss Spectroscopy When electrons pass through a sample in a TEM the interactions cause energy losses which can be used both to identify the elements present and determine their chemical state. This talk will cover the methods for recording, interpreting and quantifying energy-loss spectra. It will also cover the theory behind the features present in spectra. Some understanding of the material covered in the introduction to TEM will be useful.
***In the event that the registration is full, we will try to accomodate walk-ins should any of the registered participants turn up late for the talk(s).
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