FACTS short course - EBSD Advanced training

This 1.5 day short course is for existing EBSD users, and will cover a list of topics covering hardware and software information of EBSD technique. It is expected that users after this short course will understand the CMOS-EBSD technique better and move to the next level of application use after training.

List of topics to be covered will be as below:

1. Understand  and benefit from CMOS sensor and Symmetry detector 
2. Choose the right SEM conditions for EBSD analysis
3. Insight into EBSD indexing and related parameters in AZtecHKL
4. Practical tips for EBSD map and LAM
7. Grain size measurement using EBSD
6. EBSD data process with AZtecCrystal
5. Introduction to TKD on JSM-7800F

The short course is co-organised by FACTS and Oxford Nanoinstruments (OINA), and Dr Wu Jiang from OINA will be covering the topics above mentioned.

This course will be prioritised for existing FACTS EBSD users; other EBSD users are welcome to join - a pre-existing knowledge of EBSD is required.